Search results for "X-ray reflectivity"
showing 10 items of 16 documents
From Spherical Mesopores to Worm-Shaped Mesopores : Morphology Transition in Titania–Polystyrene-b-poly(ethylene oxide) Composite Films with Increasi…
2013
A morphology transition from spherical mesopores to worm-shaped mesopores within titania block copolymer composite thin films has been observed by varying the sol–gel reaction time from 40 min to 48 h in the four-component templating system of polystyrene-$\mathit{b}$-poly(ethylene oxide) (PS-$\mathit{b}$-PEO), 1,4-dioxane, concentrated HCl, and titanium tetraisopropoxide (TTIP) with a PS-$\mathit{b}$-PEO mass concentration of 0.25 wt.-%. The impact of the sol–gel reaction time on the local structure, long-range lateral structure, and vertical structure of the as-prepared, calcined, and UV-degraded thin films as well as the structural changes in solution have been systematically investigate…
Morphology evolution in mesoporous titania block copolymer composite films with increasing Sol-Gel reaction time
2013
A morphology evolution of thin films of titania from spherical mesopores to worm-shaped mesopores was realized by simply varying the sol–gel reaction time from 46 min to 25 h in the quadruple system consisting of polystyrene–block-poly(ethylene oxide) (PS–b-PEO), 1,4-dioxane, concentrated HCl, and titanium tetraisopropoxide (TTIP). Imaging techniques including scanning electron microscopy (SEM) and atomic force microscopy (AFM) were applied to investigate the local structure change of the as-prepared, calcined, and UV-degraded composite films. Grazing incidence small angle X-ray scattering (GISAXS) experiments prove that the structure change in local areas is representative of that over the…
Iridium metal and iridium oxide thin films grown by atomic layer deposition at low temperatures
2011
Atomic layer deposition (ALD) of both iridium and iridium oxide films at low temperatures has been studied and the resulting films have been examined by XRD, FESEM, XRR, EDX, AFM, TOF-ERDA, and four point probe measurements. Iridium oxide films were successfully grown using (MeCp)Ir(CHD) and ozone between 100 and 180 °C, however, the density of the films substantially reduced at 120 °C and below. The density reduction was accompanied by a phase change from crystalline to amorphous IrO2. Metallic iridium films were deposited between 120 and 180 °C by adding a reductive hydrogen pulse after the oxidative ozone pulse. Comparison of these processes with the earlier process employing the same Ir…
Characterization of ALD grown Ti x Al y N and Ti x Al y C thin films
2017
Abstract Atomic layer deposition (ALD) was used to grow Ti x Al y N and Ti x Al y C thin films using trimethylaluminum (TMA), titanium tetrachloride and ammonia as precursors. Deposition temperature was varied between 325 °C and 500 °C. Films were also annealed in vacuum and N 2 -atmosphere at 600–1000 °C. Wide range of characterization methods was used including time-of-flight elastic recoil detection analysis (ToF-ERDA), X-ray diffractometry (XRD), X-ray reflectometry (XRR), Raman spectroscopy, ellipsometry, helium ion microscopy (HIM), atomic force microscopy (AFM) and 4-point probe measurement for resistivity. Deposited films were roughly 100 nm thick and contained mainly desired elemen…
Coating and functionalization of high density ion track structures by atomic layer deposition
2016
In this study flexible TiO 2 coated porous Kapton membranes are presented having electron multiplication properties. 800 nm crossing pores were fabricated into 50 m thick Kapton membranes using ion track technology and chemical etching. Consecutively, 50 nm TiO 2 films were deposited i nto the pores of the Kapton membranes by atomic layer deposition using Ti( i OPr) 4 and water as precursors at 250 °C. The TiO 2 films and coated membranes were studied by scanning electro n microscopy (SEM), X - ray diffraction (XRD) and X - ray reflectometry (XRR). Au metal electrod e fabrication onto both sides of the coated foils was achieved by electron beam evaporation. The electron multipliers were o…
Kinetic behaviour of a structural phase transition in Langmuir-Blodgett multilayers studied by energy dispersive x-ray reflectivity
1992
Various multilayers of Cd stearate were prepared by means of the Langmuir-Blodgett technique and investigated at T = Ts - ΔT (Ts, melting point of LB film). The x-ray scattering spectrum was recorded in several time intervals using an energy dispersive set up. For ΔT = 3 ... 9 K the observed intensity reduction of Bragg peaks, which corresponds to the multilayer periodicity, is recorded as a function of time. In addition new peaks appear. This is interpreted in terms of a kinetically driven phase separation of the metastable LB-phase. The time needed for phase disorder and the nucleation of the new phase decreases for smaller ΔT. The measured layer spacing of the new phase is larger than th…
Study on Structural, Mechanical, and Optical Properties of Al2O3–TiO2 Nanolaminates Prepared by Atomic Layer Deposition
2015
Structural, optical, and mechanical properties of Al2O3/TiO2 nanolaminates fabricated by atomic layer deposition (ALD) were investigated. We performed transmission electron microscopy (TEM), X-ray diffraction (XRD), X-ray reflectivity (XRR), energy dispersive X-ray spectroscopy (EDX), ellipsometry, UV–vis spectroscopy, photoluminescence (PL) spectroscopy, and nanointendation to characterize the Al2O3/TiO2 nanolaminates. The main structural, optical, and mechanical parameters of Al2O3/TiO2 nanolaminates (thickness, grain size, refractive index, extinction coefficient, band gap, hardness, and Young’s module) were calculated. It was established that with decreasing of the layer thickness, the …
Structural and optical properties of TiO2–Al2O3nanolaminates produced by atomic layer deposition
2015
Structural and optical properties of Al2O3/TiO2 nanolaminates fabricated by atomic layer deposition (ALD) were investigated. We performed Raman spectroscopy, transmission electron microscopy (TEM), X-Ray reflectivity (XRR), UV-Vis spectroscopy, and photoluminescence (PL) spectroscopy to characterize the Al2O3/TiO2 nanolaminates. The main structural and optical parameters of Al2O3/TiO2 nanolaminates were calculated. It was established that with decreasing of the layer thickness, the value of band gap energy increases due to the quantum size effect related to the reduction of the nanograins size. It was also shown that there is an interdiffusion layer at the Al2O3/TiO2 interface which plays a…
Carbon coatings for soft-x-ray reflectivity enhancement
2007
In X-ray astronomical telescopes, the focalization of the radiation is achieved by means of grazing incidence Wolter I (parabola + hyperbola) optics in total reflection regime. In general, high density materials (e.g. Au, Pt, Ir, W) are used as reflecting coatings, in order to increase as much as possible the cut-off angles and energies for total reflection. However these materials present an important reduction of the reflectivity between 0.2 and 5 keV, due to the photoabsorption, and this phenomenon is particularly enhanced in correspondence of the M absorption edges (between 2 and 3.5 keV). In general, this determines a strong decrease of the telescope effective area. To overcome the pro…
Surface induced smectic order in ionic liquids - an X-ray reflectivity study of [C(22)C(1)im](+)[NTf2](-)
2017
Physical chemistry, chemical physics 19(39), 26651 - 26661 (2017). doi:10.1039/C7CP04852A